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7 NOVEMBER 2025

Waters Seminars: Innovations in Mass Spectrometry

ΠΡΟΣΚΛΗΣΗ στα Waters Seminars

ATHENS: 25 & 26 November 2025
THESSALONIKI: 27 November 2025

As official and authorized partners of Waters, it is our great pleasure to invite you to the series of specialized Waters seminars: “Innovations in Mass Spectrometry.” The topics will cover the latest developments, innovative solutions, and significant applications in the field of Mass Spectrometry (MS).

Waters Seminars: Innovations in Mass Spectrometry banner
7 NOVEMBER 2025

Waters Seminars: Innovations in Mass Spectrometry

ΠΡΟΣΚΛΗΣΗ στα Waters Seminars

ΑΘΗΝΑ: 25 & 26 Νοεμβρίου 2025
ΘΕΣΣΑΛΟΝΙΚΗ: 27 Νοεμβρίου 2025

Ως επίσημοι και εξουσιοδοτημένοι συνεργάτες του Οίκου Waters, με μεγάλη μας χαρά σας προσκαλούμε στη σειρά εξειδικευμένων σεμιναρίων Waters: “Innovations in Mass Spectrometry”. Τα θέματα καλύπτουν τις πιο πρόσφατες εξελίξεις και καινοτόμες λύσεις ως και σημαντικές εφαρμογές στον χώρο της Φασματομετρίας Μάζας (MS).

Banner with the word Notice in Greek and English
6 NOVEMBER 2025

Notice 7/11

Power outage in the area of our offices


We inform you that on Friday, November 7th, due to a scheduled power outage by the Public Power Corporation (DEI) in our area, the operation of our offices will be affected for several hours and we may not be able to operate at our full capacity.

In case of urgent issue, please call the mobile +30-6973-784991.


We thank you for your understanding.

Μπάνερ με την λέξη Ανανκοίνωση στα Ελληνικά & Αγγλικά
6 NOVEMBER 2025

Ανακοίνωση 7/11

Διακοπή Ρεύματος στην περιοχή των γραφείων μας


Σας ενημερώνουμε ότι, την Παρασκευή 7 Νοεμβρίου 2025, λόγω προγραμματισμένης διακοπής ρεύματος από τη ΔΕΗ στην περιοχή μας, η λειτουργία των γραφείων μας θα επηρεαστεί για αρκετές ώρες και πιθανόν να μην είμαστε σε θέση να ανταποκριθούμε στο μέγιστο των δυνατοτήτων μας.

Σε περίπτωση επείγοντος θέματος, παρακαλώ καλέστε το κινητό 6973-784991.


Σας ευχαριστούμε για την κατανόηση.

Banner for Waters EMEA PFAS Online Summit
23 OCTOBER 2025

Waters EMEA PFAS Online Summit Invitation - November 19

Advance Your Expertise in PFAS Analysis

EMEA PFAS Online Summit 2025

Wednesday, November 19
10:00 AM - 12:00 PM (CET)
Online Event

 

REGISTER NOW

Waters is pleased to invite you to an exclusive scientific event focused on the present and future of PFAS analysis.

Banner for Waters EMEA PFAS Online Summit
23 OCTOBER 2025

Waters EMEA PFAS Online Summit Invitation - November 19

Advance Your Expertise in PFAS Analysis

EMEA PFAS Online Summit 2025

Wednesday, November 19
10:00 AM - 12:00 PM (CET)
Online Event

 

REGISTER NOW

Waters is pleased to invite you to an exclusive scientific event focused on the present and future of PFAS analysis.

PHI Genesis Surface Analysis (ESCA-Auger, XPS, etc.)

PHYSICAL ELECTRONICS (PHI) #152

Physical Electronics (PHI) logo

PHI Genesis: Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe

The PHI Genesis is the latest generation of PHI’s highly successful multi-technique XPS product line with PHI’s patented, monochromatic, micro-focused, scanning X-ray source.

It is an easy to use, fully automated system with auto-tuning and calibration and multiple parking positions for high throughput.

The fully integrated multi-technique platform of the PHI Genesis offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.

PHI Genesis offers high sensitivity and high throughput for large area and small area down to 5 µm and unique high-throughput non-destructive depth profiling using optional hard X-ray Cr source.

The instrument is fully customizable to address all analytical needs.

  • Intuitive Sample Navigation And Confident Analysis Area Identification

  • The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available

  • Optimized Depth Profiling

  • Superior Micro-Area Analysis

  • Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis

  • Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials

CONTAINS

  • High-Sensitivity Spectral and Imaging Analysis
  • Single Crater Multi-Point Depth Profiling
  • Optimized Thin Film Depth Profile Analysis
PHYSICAL ELECTRONICS (PHI) #152

PHI Genesis Surface Analysis (ESCA-Auger, XPS, etc.)

PHYSICAL ELECTRONICS (PHI) #152

Physical Electronics (PHI) logo

PHI Genesis: Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe

The PHI Genesis is the latest generation of PHI’s highly successful multi-technique XPS product line with PHI’s patented, monochromatic, micro-focused, scanning X-ray source.

It is an easy to use, fully automated system with auto-tuning and calibration and multiple parking positions for high throughput.

The fully integrated multi-technique platform of the PHI Genesis offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.

PHI Genesis offers high sensitivity and high throughput for large area and small area down to 5 µm and unique high-throughput non-destructive depth profiling using optional hard X-ray Cr source.

The instrument is fully customizable to address all analytical needs.

  • Intuitive Sample Navigation And Confident Analysis Area Identification

  • The Only Fully Automated High-Throughput Lab-Based Multitechnique XPS/HAXPES Instrument on the Market Commercially Available

  • Optimized Depth Profiling

  • Superior Micro-Area Analysis

  • Bring HAXPES synchrotron capabilities into your lab with the PHI Genesis

  • Suite Of Specialized Solutions For In Situ Characterization Of Advanced Materials

CONTAINS

  • High-Sensitivity Spectral and Imaging Analysis
  • Single Crater Multi-Point Depth Profiling
  • Optimized Thin Film Depth Profile Analysis
PHYSICAL ELECTRONICS (PHI) #152
Banner depicting a photo of the XEVO CDMS instrument.
21 OCTOBER 2025

Break through barriers with Xevo CDMS System

The solution for your most complex high mass, high heterogeneity MS analysis

Characterizing large, complex biomolecules has long been a challenge in biopharma and structural biology, with conventional techniques falling short. The Xevo CDMS instrument overcomes these limitations, enabling precise measurement of highly heterogeneous molecules and unlocking new possibilities in drug development, cell and gene therapy, and precision medicine.

Banner depicting a photo of the XEVO CDMS instrument.
21 OCTOBER 2025

Break through barriers with Xevo CDMS System

The solution for your most complex high mass, high heterogeneity MS analysis

Characterizing large, complex biomolecules has long been a challenge in biopharma and structural biology, with conventional techniques falling short. The Xevo CDMS instrument overcomes these limitations, enabling precise measurement of highly heterogeneous molecules and unlocking new possibilities in drug development, cell and gene therapy, and precision medicine.